An overtraining-resistant stochastic modeling method for pattern recognition

Annals of Statistics

Volumn 24, Issue 6, 1996, Pages 2319-2349

  Kleinberg, E M ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

Machine learning; Pattern recognition

Indexed keywords

EID: 0030343231     PISSN: 00905364     EISSN: None     Source Type: Journal    
DOI: 10.1214/aos/1032181157     Document Type: Article

References (20)

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