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Volumn 172, Issue , 2016, Pages 165-172

Single crystal growth and electronic structure of TlPbI3

Author keywords

Crystal growth; Electronic structure; Optical materials; Photoelectron spectroscopy; Semiconductors

Indexed keywords

CORE LEVELS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; ION BOMBARDMENT; LEAD; OPTICAL MATERIALS; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; SEMICONDUCTOR GROWTH; SEMICONDUCTOR MATERIALS; SINGLE CRYSTALS; THALLIUM;

EID: 84956704568     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2016.01.058     Document Type: Article
Times cited : (35)

References (33)
  • 29
    • 0003828439 scopus 로고
    • second ed. Auger and X-Ray Photoelectron Spectroscopy John Willey & Sons Ltd. Chichester
    • D. Briggs, and P.M. Seach Practical Surface Analysis second ed. Auger and X-Ray Photoelectron Spectroscopy Vol. 1 1990 John Willey & Sons Ltd. Chichester
    • (1990) Practical Surface Analysis , vol.1
    • Briggs, D.1    Seach, P.M.2
  • 33
    • 85019313245 scopus 로고    scopus 로고
    • Handbook of optical metrology. Principles and applications
    • CRC Press
    • Handbook of optical metrology. Principles and applications Toru Yoszizawa Taylor and Francis Book 2015 CRC Press
    • (2015) Taylor and Francis Book
    • Yoszizawa, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.