Characterization of Sn-doped CuO thin films prepared by a sol–gel method

Journal of Materials Science: Materials in Electronics

Volumn 27, Issue 2, 2016, Pages 1719-1724

  Wu, Jing ^a   Hui, K S ^b   Hui, K N ^a   Li, Lei ^a   Chun, Ho Hwan ^a   Cho, Y R ^a  

^a Pusan National University   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; COPPER OXIDES; CRYSTALLITE SIZE; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY GAP; HALL MOBILITY; OPTICAL PROPERTIES; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SOLS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION;

CUO THIN FILMS; ELECTRICAL AND OPTICAL PROPERTIES; GEL METHOD; GLASS SUBSTRATES; HALL EFFECT MEASUREMENT; SN CONTENTS; SN DOPING; VISIBLE SPECTROSCOPY;

OPTICAL FILMS;

EID: 84956607658     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-015-3945-8     Document Type: Article

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