Erratum: Switching transient generation in surface interrogation scanning electrochemical microscopy and time-of-flight techniques (Analytical Chemistry (2015) 87 (12276-12280) DOI: 10.1021/acs.analchem.5b03542);Switching Transient Generation in Surface Interrogation Scanning Electrochemical Microscopy and Time-of-Flight Techniques

Analytical Chemistry

Volumn 87, Issue 24, 2015, Pages 12276-12280

  Ahn, Hyun S ^a   Bard, Allen J ^a  

^a University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLIGHT SIMULATORS; RATE CONSTANTS; REACTION INTERMEDIATES; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SURFACE REACTIONS; SWITCHING; TIME DOMAIN ANALYSIS;

DIGITAL SIMULATION; OXYGEN EVOLVING CATALYSTS; REACTIVE INTERMEDIATE; SCANNING ELECTROCHEMICAL MICROSCOPY; SURFACE INTERROGATION; SWITCHING TRANSIENT; TIME RESOLUTION; TIME-OF-FLIGHT TECHNIQUES;

ANALYTIC EQUIPMENT;

EID: 84950122998     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/acs.analchem.5b04792     Document Type: Erratum

References (9)

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