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Volumn 2000-January, Issue , 2000, Pages 784-787
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Effects of oxygen impurity on microcrystalline silicon films
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
AGGREGATES;
CARRIER CONCENTRATION;
CRYSTAL IMPURITIES;
IMPURITIES;
MICROCRYSTALLINE SILICON;
SUPERCONDUCTING FILMS;
CRYSTAL QUALITIES;
ELECTRON CARRIER DENSITY;
LOWER TEMPERATURES;
MICROCRYSTALLINE SI;
MICROCRYSTALLINE SILICON FILMS;
OXYGEN CONCENTRATIONS;
OXYGEN IMPURITY;
SUPERLINEAR;
OXYGEN;
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EID: 84949545409
PISSN: 01608371
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/PVSC.2000.916000 Document Type: Conference Paper |
Times cited : (13)
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References (9)
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