Hot carrier reliability of N-LDMOS transistor arrays for power BiCMOS applications

IEEE International Reliability Physics Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 105-110

  Brisbin, D ^a   Strachan, A ^a   Chaparala, P ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

BiCMOS integrated circuits; Bipolar transistors; Degradation; Driver circuits; Energy management; Hot carriers; Semiconductor optical amplifiers; Stress; Switches; Voltage

Indexed keywords

BIPOLAR TRANSISTORS; DEGRADATION; ELECTRIC POTENTIAL; ENERGY MANAGEMENT; HOT CARRIERS; LIGHT AMPLIFIERS; MOS DEVICES; OPTICAL SWITCHES; RELIABILITY; SEMICONDUCTOR OPTICAL AMPLIFIERS; STRESSES; SWITCHES;

BICMOS INTEGRATED CIRCUITS; DRIVER CIRCUIT; HIGH DRAIN VOLTAGE; HOT CARRIER DEGRADATION; HOT CARRIER RELIABILITY; LDMOS TRANSISTORS; SMART POWER APPLICATIONS; TEST METHODOLOGY;

TRANSISTORS;

EID: 84949201206     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2002.996617     Document Type: Conference Paper

References (8)

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2. K. Nakamura et. al., "Complementary 25V LDMOS for Analog Applications Based on 0.6 um BiCMOS Technology", BCTM 2000, pp. 94-97
3. R. Versari et. al., "Experimental Study of Hot-Carrier Effects in LDMOS Transistors", IEEE Trans. Electron Devices, ED-46, p 1228, 1999
4. V. O'Donovan et. al., "Hot Carrier Reliability of Lateral DMOS Transistors", International Reliability Physics Symposium 2000, pp. 174-179
5. A. Mouthaan et. al., "Dealing with Hot-Carrier Aging in nMOS and DMOS, Models, Simulations and Characterizations", Microelectronics Reliability 2000, pp. 909-917
6. P. Hower et. al., "Snapback and Safe Operating Area of LDMOS Transistors", IEDM 1999, pp. 193-196
7. P. Heremans et. al., "Consistent Model for Hot-Carrier Degradation in n-Channel and p-Channel MOSFET's", IEEE Trans. Electron Devices, ED-35, p 2194-2209, 1988
8. C. Hu et. al., "Hot-Electron-Induced MOSFET Degradation-Model, Monitor, and Improvement", IEEE Trans. Electron Devices, ED-32, p 375, 1985