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Volumn 2002-January, Issue , 2002, Pages 246-251

A comprehensive layout methodology and layout-specific circuit analyses for three-dimensional integrated circuits

Author keywords

Availability; Circuit analysis; Circuit simulation; Computational modeling; Design methodology; Integrated circuit technology; Performance analysis; Polymers; Three dimensional integrated circuits; Wafer bonding

Indexed keywords

AVAILABILITY; CIRCUIT SIMULATION; COMPUTER AIDED DESIGN; DESIGN; FIELD PROGRAMMABLE GATE ARRAYS (FPGA); INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUITS; POLYMERS; THREE DIMENSIONAL INTEGRATED CIRCUITS; WAFER BONDING;

EID: 84948451001     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996742     Document Type: Conference Paper
Times cited : (20)

References (12)
  • 2
    • 85013949634 scopus 로고    scopus 로고
    • Wire-Length Distribution of Three-Dimensional Integrated Circuits
    • A. Rahman, A. Fan, J. Chung, and R. Reif. Wire-Length Distribution of Three-Dimensional Integrated Circuits, Proceedings of IITC, 233-235, 1999.
    • (1999) Proceedings of IITC , pp. 233-235
    • Rahman, A.1    Fan, A.2    Chung, J.3    Reif, R.4
  • 3
    • 33646125223 scopus 로고    scopus 로고
    • Interconnect Performance Modeling for 3D Integrated Circuits with Multiple Si Layers
    • S. J. Souri, and K. C. Saraswat. Interconnect Performance Modeling for 3D Integrated Circuits with Multiple Si Layers, Proceedings of IITC, 24-26, 1999.
    • (1999) Proceedings of IITC , pp. 24-26
    • Souri, S.J.1    Saraswat, K.C.2
  • 5
  • 8
    • 4243879730 scopus 로고    scopus 로고
    • PhD Dissertation, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, January
    • A. Rahman. System-Level Performance Evaluation of Three-Dimensional Integrated Circuits, PhD Dissertation, Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, January 2001.
    • (2001) System-Level Performance Evaluation of Three-Dimensional Integrated Circuits
    • Rahman, A.1
  • 11
    • 0032187955 scopus 로고    scopus 로고
    • A Hierarchical Reliability Analysis for Circuit Design Evaluation
    • S. P. Riege, C. V. Thompson, and J. J. Clement. A Hierarchical Reliability Analysis for Circuit Design Evaluation. IEEE Transactions on ED, 45:2254, 1998.
    • (1998) IEEE Transactions on ED , vol.45 , pp. 2254
    • Riege, S.P.1    Thompson, C.V.2    Clement, J.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.