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Volumn 26, Issue 12, 2015, Pages 9226-9235

A review of high-temperature electronics technology and applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS INDUSTRY; MECHANICAL PROPERTIES;

EID: 84948089998     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-015-3459-4     Document Type: Review
Times cited : (314)

References (22)
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    • High temperature electronics pose design and reliability challenges
    • J. Watson, G. Castro, High temperature electronics pose design and reliability challenges. Analog Dialogue 46(2), 3–9 (2012)
    • (2012) Analog Dialogue , vol.46 , Issue.2 , pp. 3-9
    • Watson, J.1    Castro, G.2
  • 11
    • 49949133713 scopus 로고
    • Temperature dependence of the energy gap in semiconductors
    • Y. Varshni, Temperature dependence of the energy gap in semiconductors. Physica 34(1), 149–154 (1967)
    • (1967) Physica , vol.34 , Issue.1 , pp. 149-154
    • Varshni, Y.1
  • 13
    • 0034211184 scopus 로고    scopus 로고
    • Sensors that Can Take The Heat Part 1: Opening the High Temperature Toolbox
    • J. Goetz, Sensors that Can Take The Heat Part 1: Opening the High Temperature Toolbox. Sensors 17(6), 20–38 (2000)
    • (2000) Sensors , vol.17 , Issue.6 , pp. 20-38
    • Goetz, J.1
  • 14
    • 21544441547 scopus 로고
    • Characterization of device parameters in high-temperature metal-oxide-semiconductor field-effect transistors in B-SiC thin films
    • J.W. Palmour, H.S. Kong, R.F. Davis, Characterization of device parameters in high-temperature metal-oxide-semiconductor field-effect transistors in B-SiC thin films. Appl. Phys. Lett. 64(4), 2168–2177 (1988)
    • (1988) Appl. Phys. Lett. , vol.64 , Issue.4 , pp. 2168-2177
    • Palmour, J.W.1    Kong, H.S.2    Davis, R.F.3
  • 16
    • 0038426995 scopus 로고    scopus 로고
    • High temperature electronics—a role for wide bandgap semiconductors?
    • P. Neudeck, R.S. Okojie, L.Y. Chen, High temperature electronics—a role for wide bandgap semiconductors? Proc. IEEE 90(6), 1065–1076 (2002)
    • (2002) Proc. IEEE , vol.90 , Issue.6 , pp. 1065-1076
    • Neudeck, P.1    Okojie, R.S.2    Chen, L.Y.3
  • 19
    • 84876724829 scopus 로고    scopus 로고
    • C. Bunel, L. Lengignon, Silicon Capacitors with Extremely High Stability and Reliability Ideal for High Temperature Applications,” in International Conference on High Temper at ure Electronics (HiTEC 2012) (Albuquerque, 2012)
    • C. Bunel, L. Lengignon, Silicon Capacitors with Extremely High Stability and Reliability Ideal for High Temperature Applications,” in International Conference on High Temperature Electronics (HiTEC 2012) (Albuquerque, 2012)
  • 21
    • 84948072913 scopus 로고    scopus 로고
    • Y. Hernik, Strength and Weaknesses of Common Resistor Types. 31 May 2010. Accessed 1-2-2015
    • Y. Hernik, Strength and Weaknesses of Common Resistor Types. 31 May 2010. http://www.eetimes.com/document.asp?doc_id=1256482. Accessed 1-2-2015


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.