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Volumn 17, Issue 7, 2015, Pages 5078-5083

Quantitative depth profiling of Ce3+ in Pt/CeO2 by in situ high-energy XPS in a hydrogen atmosphere

(8) Kato, Shunsuke a Ammann, Markus a Huthwelker, Thomas a Paun, Cristina b Lampimäki, Markus a Lee, Ming Tao a Rothensteiner, Matthäus a,b Van Bokhoven, Jeroen A a,b

a PAUL SCHERRER INSTITUTE (Switzerland)

b ETH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84946925854 PISSN: 14639076 EISSN: None Source Type: Journal
DOI: 10.1039/c4cp05643d Document Type: Article

Times cited : (83)

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