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Volumn 2002-January, Issue , 2002, Pages 450-457

An RF CMOS modified-cascode LNA with inductive source degeneration

Author keywords

Cascode; Inductive degeneration; RF CMOS LNA; RF IC

Indexed keywords

ANALOG CIRCUITS; NOISE FIGURE; RADIO FREQUENCY AMPLIFIERS;

EID: 84946559173     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NRSC.2002.1022654     Document Type: Conference Paper
Times cited : (9)

References (13)
  • 1
    • 0031618630 scopus 로고    scopus 로고
    • A Low Voltage Design Technique for Low Noise RF Integrated Circuits
    • E. Abou-Allam and T. Manku," A Low Voltage Design Technique for Low Noise RF Integrated Circuits," ISCAS' 98, p. IV-373.
    • ISCAS' 98 , pp. IV-373
    • Abou-Allam, E.1    Manku, T.2
  • 2
    • 0031147079 scopus 로고    scopus 로고
    • A 1.5-V 1.5-GHz CMOS Low Noise Amplifier
    • May
    • D. K. Shaeffer and T. H. Lee, "A 1.5-V 1.5-GHz CMOS Low Noise Amplifier," IEEE J. Solid-State Circuits, vol. 32, pp. 745-759, May 1997.
    • (1997) IEEE J. Solid-State Circuits , vol.32 , pp. 745-759
    • Shaeffer, D.K.1    Lee, T.H.2
  • 3
    • 0031377461 scopus 로고    scopus 로고
    • A 1.9-GHz Wide-Band if Double Conversion CMOS Receiver for Cordless Telephone Applications
    • Dec.
    • J. C. Rudell, J. Ou, T. Cho, G. Chien, F. Brianti, J. A. Weldon, and P. R. Gray," A 1.9-GHz Wide-Band IF Double Conversion CMOS Receiver for Cordless Telephone Applications," IEEE J. Solid-State Circuits, vol. 32, pp. 2071-2088, Dec.1997.
    • (1997) IEEE J. Solid-State Circuits , vol.32 , pp. 2071-2088
    • Rudell, J.C.1    Ou, J.2    Cho, T.3    Chien, G.4    Brianti, F.5    Weldon, J.A.6    Gray, P.R.7
  • 4
    • 0033097335 scopus 로고    scopus 로고
    • Microwave CMOS- Device Physics and Design
    • March
    • T. Manku, "Microwave CMOS- Device Physics and Design," IEEE J. Solid-State Circuits, vol. 34, pp. 277-285, March 1999.
    • (1999) IEEE J. Solid-State Circuits , vol.34 , pp. 277-285
    • Manku, T.1
  • 6
    • 0022811203 scopus 로고
    • High-Frequency Noise Measurements on FET's with Small Dimensions
    • Nov.
    • A. A. Abidi, " High-Frequency Noise Measurements on FET's with Small Dimensions," IEEE Transactions On Electron Devices, vol. ED-33, Nov. 1986.
    • (1986) IEEE Transactions on Electron Devices , vol.ED-33
    • Abidi, A.A.1
  • 10
    • 0032123968 scopus 로고    scopus 로고
    • The Impact of Scaling Down to Deep Submicron on CMOS RF Circuits
    • July
    • Q. Huang, F. Piazza, P. Orsatti, and T. Ohguro, " The Impact of Scaling Down to Deep Submicron on CMOS RF Circuits," IEEE J. Solid-State Circuits, vol. 33, pp. 1023-1036, July 1998.
    • (1998) IEEE J. Solid-State Circuits , vol.33 , pp. 1023-1036
    • Huang, Q.1    Piazza, F.2    Orsatti, P.3    Ohguro, T.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.