Current-limiting challenges for all-spin logic devices

Scientific Reports

Volumn 5, Issue , 2015, Pages

  Su, Li ^a,b,c   Zhang, Youguang ^a   Klein, Jacques Olivier ^b,c   Zhang, Yue ^a   Bournel, Arnaud ^b,c   Fert, Albert ^a,c   Zhao, Weisheng ^a,b,c  

^a BEIHANG UNIVERSITY   (China)

^b UNIV PARIS SUD   (France)

^c CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84943611916     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep14905     Document Type: Article

References (41)

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