Temperature Calibration for In Situ Environmental Transmission Electron Microscopy Experiments

Microscopy and Microanalysis

Volumn 21, Issue 6, 2015, Pages 1622-1628

  Winterstein, Jonathan P ^a,b   Lin, Pin Ann ^b,c   Sharma, Renu ^b  

^a Thermo Fisher Scientific   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

Author keywords

environmental TEM; in situ; selected area diffraction; temperature measurement

Indexed keywords

EID: 84943339246     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927615015196     Document Type: Article

References (17)

1. ALLARD, L.F., BIGELOW, W.C., JOSE-YACAMAN, M., NACKASHI, D.P., DAMIANO, J. & MICK, S.E. (2009). A new MEMS-based system for ultra-high-resolution imaging at elevated temperatures. Microsc Res Tech 72(3), 208-215.
2. BAKER, R.T.K. & HARRIS, P.S. (1972). Controlled atmosphere electron microscopy. J Phys E 5(8), 793.
3. BRINTLINGER, T., QI, Y., BALOCH, K.H., GOLDHABER-GORDON, D. & CUMINGS, J. (2008). Electron thermal microscopy. Nano Lett 8(2), 582-585.
4. CROZIER, P. (2006). The fundamental role of in situ electron microscopy in catalytic science. Microsc Microanal 12(Suppl S02), 768-769.
5. GRAY, D.E. Ed. (1972). American Institute of Physics Handbook, 3rd ed. New York, NY: McGraw-Hill.
6. HULL, R., DEMAREST, J., DUNN, D., STACH, E.A. & YUAN, Q. (1998). Applications of ion microscopy and in situ electron microscopy to the study of electronic materials and devices. Microsc Microanal 4(3), 308-316.
7. KRÄMER, S. & MAYER, J. (1999). Using the Hough transform for HOLZ line identification in convergent beam electron diffraction. J Microsc 194(1), 2-11.
8. KREITH, F. & BOHN, M.S. (1997). Principles of Heat Transfer. Boston, MA: PWS Publishing.
9. MITCHELL, D.R.G. (2008). Circular Hough transform diffraction analysis: A software tool for automated measurement of selected area electron diffraction patterns within Digital Micrograph™. Ultramicroscopy 108(4), 367-374.
10. PICHER, M., MAZZUCCO, S., BLANKENSHIP, S. & SHARMA, R. (2015). Vibrational and optical spectroscopies integrated with environmental transmission electron microscopy. Ultramicroscopy 150, 10-15.
11. ROSS, F.M. (2010). Controlling nanowire structures through real time growth studies. Rep Prog Phys 73(11), 114501.
12. SHARMA, R. (2001). Design and applications of environmental cell transmission electron microscope for in situ observations of gas-solid reactions. Microsc Microanal 7(06), 494-506.
13. SIMMONS, R.O. (1970). Use of fcc metals as internal temperature standards in X-ray diffraction. J Appl Phys 41(5), 2235-2240.
14. STACH, E.A., HULL, R., BEAN, J.C., JONES, K.S. & NEJIM, A. (1998). In situ studies of the interaction of dislocations with point defects during annealing of ion implanted Si/SiGe/Si (001) heterostructures. Microsc Microanal 4(3), 294-307.
15. SUH, I.-K., OHTA, H. & WASEDA, Y. (1988). High-temperature thermal expansion of six metallic elements measured by dilatation method and X-ray diffraction. J Mater Sci 23(2), 757-760.
16. VENDELBO, S.B., KOOYMAN, P.J., CREEMER, J.F., MORANA, B., MELE, L., DONA, P., NELISSEN, B.J. & HELVEG, S. (2013). Method for local temperature measurement in a nanoreactor for in situ high-resolution electron microscopy. Ultramicroscopy 133, 72-79.
17. YANG, J.C. & ZHOU, G. (2012). In situ ultra-high vacuum transmission electron microscopy studies of the transient oxidation stage of Cu and Cu alloy thin films. Micron 43(11), 1195-1210.