Rapid, all-optical crystal orientation imaging of two-dimensional transition metal dichalcogenide monolayers

Applied Physics Letters

Volumn 107, Issue 11, 2015, Pages

  David, Sabrina N ^a   Zhai, Yao ^a   Van Der Zande, Arend M ^b,c   O'Brien, Kevin ^d   Huang, Pinshane Y ^c   Chenet, Daniel A ^b   Hone, James C ^b   Zhang, Xiang ^d,e,f   Yin, Xiaobo ^a  

^a UCB 450   (United States)

^b Department of Mechanical Engineering University of Colorado ^*  (United States)

^c University of Illinois at Urbana Champaign   (United States)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN GROWTH; GRAPHENE; GROWTH (MATERIALS); HARMONIC GENERATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDUSTRIAL RESEARCH; MATERIALS PROPERTIES; NONLINEAR OPTICS; TRANSITION METALS; TRANSMISSION ELECTRON MICROSCOPY;

CHARACTERIZATION METHODS; CRYSTAL GROWTH TECHNIQUES; DARK-FIELD TRANSMISSION ELECTRON MICROSCOPY; GRAIN BOUNDARY EFFECTS; INDUSTRIAL-SCALE PRODUCTION; SELECTED AREA ELECTRON DIFFRACTION; TRANSITION METAL DICHALCOGENIDES; TWO DIMENSIONAL (2 D);

CRYSTAL ORIENTATION;

EID: 84941992340     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4930232     Document Type: Article

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