Vibrational-loss EELS and the avoidance of radiation damage

Ultramicroscopy

Volumn 159, Issue P1, 2015, Pages 95-100

  Egerton, R F ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

Electron energy loss spectroscopy; Monochromator; Phonons; Radiation damage; STEM; Vibrational energy loss

Indexed keywords

ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; INELASTIC SCATTERING; MONOCHROMATORS; PHONONS; RADIATION DAMAGE;

DELOCALIZATIONS; ENERGY-FILTERED IMAGING; HIGH RESOLUTION MONOCHROMATORS; SIGNAL STRENGTHS; SPATIAL RESOLUTION; STEM; VIBRATIONAL ENERGIES; VIBRATIONAL MODES;

HIGH ENERGY FORMING;

ARTICLE; ELECTRON BEAM; ELECTRON TRANSPORT; ENERGY TRANSFER; IMAGE PROCESSING; IONIZATION; MATHEMATICAL MODEL; PHONON; RADIATION DOSE; RADIATION INJURY; RADIATION SCATTERING; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VIBRATIONAL MODE ENERGY LOSS SPECTROSCOPY;

EID: 84940476424     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2015.08.003     Document Type: Article

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