High resolution optical and vibrational spectroscopy with low loss EELS

Microscopy and Microanalysis

Volumn 20, Issue 3, 2014, Pages 590-591

  Cueva, Paul ^a   Muller, David A ^a  

^a School of Operations Research and Industrial Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84927928606     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192761400467X     Document Type: Conference Paper

References (4)

1. R. F. Egerton, J. Elec. Microsc., 48(6) (1999) 711-716
2. J. M. Auerhammer and P. Rez, Phys. Rev. B, 40 (1989) 2024-2030
3. D. W. Essex, et al., Ultramicroscopy, 80(3) (1999) 183-192
4. R. F. Egerton, EELS in the Electron Microscope, equation 5. 17