Enhancement of Radiative Plasmon Decay by Hot Electron Tunneling

ACS Nano

Volumn 9, Issue 8, 2015, Pages 8176-8183

  Wang, Xiao ^a   Braun, Kai ^a   Zhang, Dai ^a   Peisert, Heiko ^a   Adler, Hilmar ^a   Chassé, Thomas ^a   Meixner, Alfred J ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

hot electrons; inelastic electron tunneling; plasmons; tip enhanced near field optical microscopy

Indexed keywords

BIAS VOLTAGE; ELECTRIC FIELDS; ELECTRON TUNNELING; ELECTRONS; PHOTONS; PLASMONS; SEMICONDUCTOR QUANTUM WELLS;

CHARACTERISTIC BANDS; ELECTRIC FIELD COMPONENTS; ELECTROLUMINESCENCE SPECTRA; INELASTIC ELECTRON TUNNELING; INELASTIC TUNNELING; INTER-BAND TRANSITION; NEAR FIELD OPTICAL MICROSCOPY; PHOTOLUMINESCENCE SPECTRUM;

HOT ELECTRONS;

EID: 84940055716     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b02361     Document Type: Article

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