Effects of annealing temperature on the physicochemical, optical and photoelectrochemical properties of nanostructured hematite thin films prepared via electrodeposition method

Materials Research Bulletin

Volumn 69, Issue , 2015, Pages 71-77

  Phuan, Yi Wen ^a   Chong, Meng Nan ^a   Zhu, Tao ^a   Yong, Siek Ting ^a   Chan, Eng Seng ^a  

^a MONASH UNIVERSITY MALAYSIA   (Malaysia)

Author keywords

Electrochemical properties; Optical properties; Surface properties; Thin films; X ray diffraction

Indexed keywords

ANNEALING; CHEMICAL STABILITY; CHLORINE COMPOUNDS; CRYSTALLINITY; ELECTROCHEMICAL PROPERTIES; ELECTRODEPOSITION; ELECTRODES; ELECTROLYTES; ENAMELS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY GAP; EXCITONS; FIELD EMISSION MICROSCOPES; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN BOUNDARIES; HEMATITE; HYDROGEN PRODUCTION; IMAGE ENHANCEMENT; LIGHT ABSORPTION; MORPHOLOGY; NANOCOMPOSITES; NANOCRYSTALLITES; NANOCRYSTALS; OPTICAL PROPERTIES; OXIDE FILMS; PHOTOCURRENTS; PHOTOELECTROCHEMICAL CELLS; PHYSICOCHEMICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SILVER COMPOUNDS; SODIUM HYDROXIDE; SURFACE PROPERTIES; TIN OXIDES; ULTRAVIOLET VISIBLE SPECTROSCOPY; WATER ABSORPTION; X RAY DIFFRACTION;

CATHODIC ELECTRODEPOSITION; ELECTRODEPOSITION METHODS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FLUORINE DOPED TIN OXIDE; GRAIN BOUNDARY RESISTANCE; PHOTOELECTROCHEMICAL PROPERTIES; UV VISIBLE SPECTROSCOPY;

THIN FILMS;

EID: 84939979254     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2014.12.059     Document Type: Article

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