Structural, optical and electrical properties of undoped polycrystalline hematite thin films produced using filtered arc deposition

Thin Solid Films

Volumn 516, Issue 8, 2008, Pages 1716-1724

  Glasscock, J A ^a   Barnes, P R F ^a   Plumb, I C ^a   Bendavid, A ^a   Martin, P J ^a  

^a CSIRO   (Australia)

Author keywords

Fe2O3; Electrical properties; Filtered arc deposition; Hardness; Optical properties; Physical vapour deposition (PVD); Scanning electron microscopy; X ray diffraction

Indexed keywords

ELASTIC MODULI; ENERGY GAP; HEMATITE; PHYSICAL VAPOR DEPOSITION; POROSITY; REFRACTIVE INDEX; THIN FILMS;

ARRHENIUS PLOT; ELECTRICAL PROPERTIES; FILTERED ARC DEPOSITION;

POLYCRYSTALLINE MATERIALS;

EID: 38649134488     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.05.020     Document Type: Article

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