Tunneling Electrical Connection to the Interior of Metal-Organic Frameworks

Journal of the American Chemical Society

Volumn 137, Issue 25, 2015, Pages 8169-8175

  Han, Shuangbing ^a,b   Warren, Scott C ^c   Yoon, Seok Min ^d   Malliakas, Christos D ^b   Hou, Xianliang ^a,b   Wei, Yanhu ^a,b   Kanatzidis, Mercouri G ^b   Grzybowski, Bartosz A ^d  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c The University of North Carolina at Chapel Hill   (United States)

^d Ulsan National Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; CRYSTALLINE MATERIALS; DIFFUSION; ELECTRIC CONNECTORS; FUEL CELLS; JAVA PROGRAMMING LANGUAGE; ORGANOMETALLICS; PHOTOCONDUCTIVITY;

EFFECTIVE DIFFUSION COEFFICIENTS; ELECTRICAL CONDUCTIVITY; ELECTRICAL CONDUCTORS; ELECTRICAL CONNECTION; ELECTRICALLY CONDUCTIVE; METAL ORGANIC FRAMEWORK; METALORGANIC FRAMEWORKS (MOFS); ORDERS OF MAGNITUDE;

HYBRID MATERIALS;

CYCLODEXTRIN; METAL NANOCLUSTER; METAL NANOPARTICLE; METAL ORGANIC FRAMEWORK; NANOMATERIAL; RUBIDIUM; SILVER NITRATE; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC EMISSION SPECTROMETRY; DIELECTRIC CONSTANT; ELECTRIC BATTERY; ELECTRIC CONDUCTIVITY; ELECTRON; ELECTRON TRANSPORT; LIGHT DARK CYCLE; LIGHT INTENSITY; PARTICLE SIZE; POROSITY; ROENTGEN SPECTROSCOPY; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE AREA; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84935104786     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/jacs.5b03263     Document Type: Article

References (47)

1. Long, J. R.; Yaghi, O. M. Chem. Soc. Rev. 2009, 38, 1213-1214
2. Li, J.-R.; Kuppler, R. J.; Zhou, H.-C. Chem. Soc. Rev. 2009, 38, 1477-1504
3. Rowsell, J. L. C.; Yaghi, O. M. Angew. Chem., Int. Ed. 2005, 44, 4670-4679
4. Férey, G.; Milange, F.; Morcrette, M.; Serre, C.; Doublet, M. L.; Grenèche, J. M.; Tarascon, J. M. Angew. Chem., Int. Ed. 2007, 46, 3259-3263
5. Wiers, B. M.; Foo, M.-L.; Balsara, N. P.; Long, J. R. J. Am. Chem. Soc. 2011, 133, 14522-14525
6. Nohra, B.; Moll, H. E.; Albelo, L. M. R.; Mialan, P.; Marrot, J.; Draznieks, C. M.; O'Keeffe, M.; Biboum, R. N.; Lemaire, J.; Keita, B.; Nadjo, L.; Dolbecq, A. J. Am. Chem. Soc. 2011, 133, 13363-13374
7. Wang, C.; Xie, Z.; deKrafft, K. E.; Lin, W. J. Am. Chem. Soc. 2011, 133, 13445-13454
8. Lee, D. Y.; Yoon, S. J.; Shrestha, N. K.; Lee, S. H.; Ahn, H.; Han, S. H. Microporous Mesoporous Mater. 2012, 153, 163-165
9. Díaz, R.; Orcajo, M. G.; Botas, J. A.; Calleja, G.; Palma, J. Mater. Lett. 2012, 68, 126-128
10. Kreno, L. E.; Kreno, L. E.; Leong, K.; Farha, O.; Allendorf, M.; Van Duyne, R. P.; Hupp, J. T. Chem. Rev. 2011, 112, 1105-1125
11. Talin, A. A.; Centrone, A.; Ford, A. C.; Foster, M. E.; Stavila, V.; Haney, P.; Kinney, R. A.; Szalai, V.; Gabaly, F. E.; Yoon, H. P.; Léonard, F.; Allendorf, M. D. Science 2014, 343, 66-69
12. Hendon, C. H.; Tiana, D.; Walsh, A. Phys. Chem. Chem. Phys. 2012, 14, 13120-13132
13. Kobayashi, Y.; Jacobs, B.; Allendorf, M. D.; Long, J. R. Chem. Mater. 2010, 22, 4120-4122
14. Allendorf, M. D.; Schwartzberg, A.; Stavila, V.; Talin, A. A. Chem.-Eur. J. 2011, 17, 11372-11388
15. Fuma, Y.; Ebihara, M.; Kutsumizu, S.; Kawamura, T. J. Am. Chem. Soc. 2004, 126, 12238-12239
16. Sheberla, D.; Sun, L.; Blood-Gorsythe, M. A.; Er, S.; Wade, C. R.; Brozek, C. K.; Aspuru-Guzik, A.; Dincə, M. J. Am. Chem. Soc. 2014, 136, 8859-8862
17. Narayan, T. C.; Miyakai, T.; Seki, S.; Dincə, M. J. Am. Chem. Soc. 2012, 134, 12932-12935
18. Uemura, T.; Uchida, N.; Asano, A.; Saeki, A.; Seki, S.; Tsujimoto, M.; Isoda, S.; Kitagawa, S. J. Am. Chem. Soc. 2012, 134, 8360-8363
19. Gándara, F.; Uribe-Romo, F. J.; Britt, D. K.; Furukawa, H.; Lei, L.; Cheng, R.; Duan, X.; O'Keeffe, M.; Yaghi, O. M. Chem.-Eur. J. 2012, 18, 10595-10601
20. Givaja, G.; Amo-Ochoa, P.; Gomez-Garcia, C. J.; Zamora, F. Chem. Soc. Rev. 2012, 41, 115-147
21. D'Alessandro, D. M.; Kanga, J. R. R.; Caddy, J. S. Aust. J. Chem. 2011, 64, 718-722
22. Yin, Z.; Wang, Q.-X.; Zeng, M.-H. J. Am. Chem. Soc. 2012, 134, 4857-4863
23. Dragasser, A.; Shekhah, O.; Zybaylo, O.; Shen, C.; Buck, M.; Wöll, C.; Schlettwein, D. Chem. Commun. 2012, 48, 663-665
24. Leonard, F.; Talin, A. A. Nat. Nanotechnol. 2011, 6, 773-783
25. Yoon, S. M.; Warren, S. C.; Grzybowski, B. A. Angew. Chem., Int. Ed. 2014, 126, 4526-4530
26. Gasteiger, H. A.; Kocha, S. S.; Sompalli, B.; Wagner, F. T. Appl. Catal., B 2005, 56, 9-35
27. Han, S.; Wei, Y.; Valente, C.; Forgan, R. S.; Gassensmith, J. J.; Smaldone, R. A.; Nakanishi, H.; Coskun, A.; Stoddart, J. F.; Grzybowski, B. A. Angew. Chem., Int. Ed. 2011, 50, 276-279
28. Wei, Y.; Han, S.; Walker, D. A.; Fuller, P. E.; Grzybowski, B. A. Angew. Chem., Int. Ed. 2012, 51, 7435-7439
29. Wilcoxon, J. P.; Martin, J. E.; Provencio, P. J. Chem. Phys. 2001, 115, 998-1008
30. Bakr, O. M.; Amendola, V.; Alkens, C. M.; Wenseleers, W.; Li, R.; Negro, L. D.; Schatz, G. C.; Stellaci, F. S. Angew. Chem., Int. Ed. 2009, 121, 6035-6040
31. Hsieh, C.-H.; Chou, L.-J.; Lin, G.-R.; Bando, Y.; Golberg, D. Nano Lett. 2008, 8, 3081-3085
32. Hu, M. S.; Chen, H.-L.; Shen, C. H.; Hong, L. S.; Huang, B. R.; Chen, K. H.; Chen, L. C. Nat. Mater. 2006, 5, 102-106
33. Huang, C.-H.; Lin, H. Y.; Lau, B. C.; Liu, C. Y.; Chui, H. C.; Tzeng, Y. Opt. Express 2010, 18, 27891-27899
34. Wessels, J. M.; Nothofer, H. G.; Ford, W. E.; von Wrochem, F.; Scholz, F.; Vossmeyer, T.; Schroedter, A.; Weller, H.; Yasuda, A. J. Am. Chem. Soc. 2004, 126, 3349-3356
35. Zabet-Khosousi, A.; Dhirani, A.-A. Chem. Rev. 2008, 108, 4072-4124
36. Warren, S. C.; Perkins, M. R.; Adams, A. M.; Kamperman, M.; Burns, A. A.; Arora, H.; Herz, E.; Suteewong, T.; Sai, H.; Li, Z.; Werner, J.; Song, J.; Werner-Zwanziger, U.; Zwanziger, J. W.; Grätzel, M.; DiSalvo, F. J.; Wiesner, U. Nat. Mater. 2012, 11, 460-467
37. Neugebauer, C. A.; Webb, M. B. J. Appl. Phys. 1962, 33, 74-82
38. Zallen, R. The physics of amorphous solids; Wiley-VCH Verlag GmbH & Co. KGaA: Weinheim, Germany, 1983.
39. Zagorodniy, K.; Seifert, G.; Hermann, H. Appl. Phys. Lett. 2010, 97, 251905-251902
40. Chemical Rubber Company. CRC handbook of chemistry and physics, 79 th ed., CRC Press: Boca Raton, FL, 1999.
41. The dielectric constant of the MOF was calculated by determining the volume fraction of the MOF that is composed of open pore space (58.3%) and cyclodextrin (41.7%, percentages estimated in Materials Studio modeling environment). Dextrin has a dielectric constant of 2.3 (ref 31). We took an average of the dielectric constant of vacuum and dextrin, weighted by the relative volume fraction of each to get the estimated dielectric constant of 1.54. This is consistent with values that have been calculated elsewhere (ref 30).
42. McCreery, R. L. Chem. Mater. 2004, 15, 4477-4496
43. Houk, R. J. T.; Jacobs, B. W.; Gabaly, F. E.; Chang, N. N.; Talin, A. A.; Graham, D. D.; House, S. D.; Robertson, I. M.; Allendorf, M. D. Nano Lett. 2009, 9, 3413-3418
44. Juan-Alcaniz, J.; Gascon, J.; Kapteijn, F. J. Mater. Chem. 2012, 22, 10102-10118
45. Warren, S. C.; Voïtchovsky, K.; Dotan, H.; Leroy, C. M.; Cornuz, M.; Stellacci, F.; Hébert, C.; Rothschild, A.; Grätzel, M. Nat. Mater. 2013, 12, 842-849
46. Choi, S. H.; Kim, B. S.; Frisbie, C. D. Science 2008, 320, 1482-1486
47. Huynh, M. H. V.; Meyer, T. J. Chem. Rev. 2007, 107, 5004-5064