Porous, conductive metal-triazolates and their structural elucidation by the charge-flipping method

Chemistry - A European Journal

Volumn 18, Issue 34, 2012, Pages 10595-10601

  Gándara, Felipe ^a   Uribe Romo, Fernando J ^a   Britt, David K ^a   Furukawa, Hiroyasu ^a   Lei, Liao ^a   Cheng, Rui ^a   Duan, Xiangfeng ^a   O'Keeffe, Michael ^a   Yaghi, Omar M ^a,b,c,d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

charge flipping; electrical conductivity; metal organic frameworks; porous materials; X ray diffraction

Indexed keywords

CHARGE FLIPPING; DISPLAY SURFACE; DIVALENT METAL ION; ELECTRICAL CONDUCTIVITY; HIGH SURFACE AREA; ISOSTRUCTURAL; METAL CENTERS; METAL ORGANIC FRAMEWORK; MICROCRYSTALLINE POWDERS; NITROGEN ATOM; OCTAHEDRALLY COORDINATED; PORE APERTURE; POROUS CRYSTALS; PRECISE CONTROL; STRUCTURAL ELUCIDATION;

COBALT; COORDINATION REACTIONS; CRYSTAL ATOMIC STRUCTURE; ELECTRIC CONDUCTIVITY; MANGANESE; METAL IONS; METALS; NITROGEN COMPOUNDS; POROUS MATERIALS; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; ZINC;

COPPER;

EID: 84865017829     PISSN: 09476539     EISSN: 15213765     Source Type: Journal    
DOI: 10.1002/chem.201103433     Document Type: Article

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