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Volumn 12, Issue 7, 2015, Pages 653-656

Traction microscopy to identify force modulation in subresolution adhesions

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ALGORITHM; ARTICLE; COMPUTER PROGRAM; FORCE; MICROSCOPY; MODULATION; NOISE; PRIORITY JOURNAL; TRACTION MICROSCOPY; CELL ADHESION; CELL CULTURE; FLUORESCENCE MICROSCOPY; PROCEDURES; SOFTWARE;

EID: 84934437770     PISSN: 15487091     EISSN: 15487105     Source Type: Journal    
DOI: 10.1038/nmeth.3430     Document Type: Article
Times cited : (129)

References (32)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.