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Volumn 219, Issue , 2015, Pages 346-353

NO sensing by single crystalline WO3 nanowires

Author keywords

DRIFT; NO sensing; Surface defect; WO3 nanowire; XPS

Indexed keywords

CRYSTALLINE MATERIALS; SURFACE DEFECTS; TUNGSTEN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84930641607     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2015.05.036     Document Type: Article
Times cited : (121)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.