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Nanoscale

Volumn 7, Issue 19, 2015, Pages 8962-8967

Nano-scale displacement sensing based on van der Waals interactions

(3) Hu, Lin a Zhao, Jin a Yang, Jinlong a

a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ATOMS; CALCULATIONS; ELECTRONIC STRUCTURE; ENERGY GAP; NANOSENSORS; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; VAN DER WAALS FORCES;

FIRST-PRINCIPLES CALCULATION; INTERLAYER DISPLACEMENTS; LATERAL DISPLACEMENTS; STACKING CONFIGURATIONS; TWO DIMENSIONAL (2 D); VAN DER WAALS INTERACTION; VAN DER WAALS INTERACTIONS; VERTICAL DISPLACEMENTS;

CORRUGATED MATERIALS;

EID: 84929180247 PISSN: 20403364 EISSN: 20403372 Source Type: Journal
DOI: 10.1039/c5nr00023h Document Type: Article

Times cited : (19)

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