Structures and characteristics of delafossite CuCr1-xO2 thin films prepared by pulsed laser deposition

Micro and Nano Letters

Volumn 9, Issue 12, 2014, Pages 854-857

  Sidik, Umar ^a   Kim, Jung Hee ^a   Kim, Hae Kyoung ^a   Lee, Hee Young ^a   Lee, Jai Yeoul ^a  

^a Yeungnam University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; COPPER COMPOUNDS; CRYSTALLINITY; ELECTRIC CONDUCTIVITY; OPTICAL PROPERTIES; PULSED LASER DEPOSITION; PULSED LASERS; SAPPHIRE; SINGLE CRYSTALS; SUBSTRATES;

DELAFOSSITES; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL CONDUCTIVITY; INCREASED TEMPERATURE; OXYGEN PARTIAL PRESSURE; PROCESSING PARAMETERS; SUBSTRATE TEMPERATURE; THIN-FILM PROPERTIES;

THIN FILMS;

COPPER; CRYSTALLIN; DELAFOSSITE; IRON OXIDE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; ELECTRIC CONDUCTIVITY; FILM; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; SYNTHESIS; X RAY DIFFRACTION;

EID: 84928230687     PISSN: None     EISSN: 17500443     Source Type: Journal    
DOI: 10.1049/mnl.2014.0385     Document Type: Article

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