Tip-enhanced Raman mapping of local strain in graphene

Nanotechnology

Volumn 26, Issue 17, 2015, Pages 1-6

  Beams, Ryan ^a   Cançado, Luiz Gustavo ^b   Jorio, Ado ^b   Vamivakas, A Nick ^a   Novotny, Lukas ^c  

^a UNIVERSITY OF ROCHESTER   (United States)

^b FEDERAL UNIVERSITY OF MINAS GERAIS   (Brazil)

^c ETH ZURICH   (Switzerland)

Author keywords

Graphene; Raman scattering; Strain

Indexed keywords

NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; RAMAN SCATTERING; STRAIN;

CIRCULAR MEMBRANES; FORCE DISPLACEMENT; FORCE-DISPLACEMENT MEASUREMENTS; RADIAL DIRECTION; RADIAL STRAINS; RAMAN MAPPING; SUSPENDED GRAPHENE; TIP-ENHANCED RAMAN SPECTROSCOPY;

GRAPHENE;

EID: 84926433155     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/26/17/175702     Document Type: Article

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