Thickness and structure change of titanium(IV) oxide thin films synthesized by the sol-gel spin coating method

Optical Materials

Volumn 36, Issue 10, 2014, Pages 1739-1744

  Lewkowicz, Aneta ^a   Synak, Anna ^a   Grobelna, Beata ^b   Bojarski, Piotr ^a   Bogdanowicz, Robert ^c   Karczewski, Jakub ^c   Szczodrowski, Karol ^a   Behrendt, Mirosław ^a  

^a Institute of Experimental Physics   (Poland)

^b UNIVERSITY OF GDA SK   (Poland)

^c GDANSK UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Anatase; Rutile; Sol gel method; Titanium dioxide

Indexed keywords

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; ENERGY GAP; MAGNETIC SEMICONDUCTORS; OXIDE FILMS; OXIDE MINERALS; REFRACTIVE INDEX; SOL-GEL PROCESS; TITANIUM DIOXIDE; TITANIUM OXIDES; X RAY DIFFRACTION;

ELLIPSOMETRIC MEASUREMENTS; OXIDE THIN FILMS; RUTILE; SOL-GEL SPIN COATING METHOD; STRUCTURAL CHARACTERISTICS; STRUCTURE CHANGE; TITANIUM DIOXIDE THIN FILM; TITANIUM DIOXIDES (TIO2);

THIN FILMS;

EID: 84925291136     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2014.02.033     Document Type: Article

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