Microstructural, Impedance Spectroscopic and Potentiometric Analysis of Ta2O5 Electrochemical Thick Film pH Sensors

Electroanalysis

Volumn 27, Issue 3, 2015, Pages 770-781

  Manjakkal, Libu ^a   Cvejin, Katarina ^a   Bajac, Branimir ^b   Kulawik, Jan ^a   Zaraska, Krzysztof ^a   Szwagierczak, Dorota ^a  

^a ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^b UNIVERSITY OF NOVI SAD   (Serbia)

Author keywords

Electrochemical impedance spectroscopy; PH sensors; Potentiometry; Tantalum oxide; Thick films

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ELECTRIC IMPEDANCE; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; OXIDE FILMS; PH; PH SENSORS; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; THICK FILMS; X RAY DIFFRACTION;

ALUMINA SUBSTRATES; ELECTROCHEMICAL-IMPEDANCE SPECTROSCOPIES; ELECTROCHEMICALS; MICRO-STRUCTURAL; PH SENSOR; POTENTIOMETRIC ANALYSIS; POTENTIOMETRICS; POTENTIOMETRY; PROPERTY; SCREEN-PRINTED;

TANTALUM OXIDES;

EID: 84924717639     PISSN: 10400397     EISSN: 15214109     Source Type: Journal    
DOI: 10.1002/elan.201400571     Document Type: Article

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