Towards RIP using free-electron laser SFX data

Journal of Synchrotron Radiation

Volumn 22, Issue 2, 2015, Pages 249-255

  Galli, Lorenzo ^a,b   Son, Sang Kil ^a,b   White, Thomas A ^a   Santra, Robin ^a,b   Chapman, Henry N ^a,b   Nanao, Max H ^c  

^a DESY   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

^c EUROPEAN MOLECULAR BIOLOGY LABORATORY   (France)

Author keywords

phasing; radiation damage; SFX Includes papers presented at the 8th International Workshop on X ray Radiation Damage to Biological Crystalline Samples; X ray FEL

Indexed keywords

FREE ELECTRON LASERS; RADIATION DAMAGE; X RAY CRYSTALLOGRAPHY; X RAYS;

EXPERIMENTAL CONDITIONS; INTERNATIONAL WORKSHOPS; PHASING; RADIATION-DAMAGE INDUCED PHASING; SERIAL FEMTOSECOND CRYSTALLOGRAPHIES; STANDARD SOFTWARE; SULFUR ATOMS; X-RAY FEL;

ELECTRONS;

CATHEPSIN; CATHEPSIN B;

CHEMICAL STRUCTURE; CHEMISTRY; ELECTRON; HUMAN; LASER; MEASUREMENT ACCURACY; PROCEDURES; PROTEIN CONFORMATION; RADIATION INJURY; RADIATION RESPONSE; RADIATION SCATTERING; SENSITIVITY AND SPECIFICITY; THEORETICAL MODEL; X RAY CRYSTALLOGRAPHY;

CATHEPSIN B; CATHEPSINS; CRYSTALLOGRAPHY, X-RAY; DATA ACCURACY; ELECTRONS; HUMANS; LASERS; MODELS, MOLECULAR; MODELS, THEORETICAL; PROTEIN CONFORMATION; RADIATION INJURIES; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY;

EID: 84924252021     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514027854     Document Type: Conference Paper

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