Determination of multiwavelength anomalous diffraction coefficients at high x-ray intensity

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 46, Issue 16, 2013, Pages

  Son, Sang Kil ^a,b   Chapman, Henry N ^a,b   Santra, Robin ^a,b  

^a DESY   (Germany)

^b UNIVERSITY OF HAMBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANOMALOUS DIFFRACTION; CRYSTALLINE SAMPLES; EXPERIMENTAL PROCEDURE; FLUORESCENCE MEASUREMENTS; MULTIWAVELENGTH; PULSE PARAMETER; X RAY INTENSITY; X-RAY FREE ELECTRON LASERS;

DIFFRACTION; X RAYS;

X RAY CRYSTALLOGRAPHY;

EID: 84883195165     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/46/16/164015     Document Type: Article

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