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Applied Physics Letters

Volumn 106, Issue 8, 2015, Pages

Probing patterned defects on graphene using differential interference contrast observation

(2) Yang, Gwangseok a Kim, Jihyun a

a Korea University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHENE; IMAGING TECHNIQUES; LIQUID CRYSTALS; NEMATIC LIQUID CRYSTALS; OXYGEN; PHOTOLITHOGRAPHY; PLASMA APPLICATIONS; RAMAN SPECTROSCOPY; SCALABILITY;

DIFFERENTIAL INTERFERENCE CONTRAST; MICRO RAMAN SPECTROSCOPY; OPTICAL IMAGING TECHNIQUE; OXYGEN PLASMA TREATMENTS; OXYGEN PLASMAS; PATTERNED DEFECTS; REFLECTED LIGHT; SCALABLE METHODS;

DEFECTS;

EID: 84923380928 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4908289 Document Type: Article

Times cited : (6)

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