Experimental studies of resolution in scanning ion conductance microscopy

Journal of the Electrochemical Society

Volumn 161, Issue 14, 2014, Pages H924-H929

  Weber, Anna E ^a   Baker, Lane A ^a  

^a INDIANA UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; PROBES;

CONTROLLED SIZE; FEEDBACK MODE; FOCUSED ION BEAM MILLING; IMAGING PARAMETERS; PROBE SURFACE; SCANNING ION CONDUCTANCE MICROSCOPIES; SPATIAL RESOLUTION; TOPOGRAPHIC IMAGES;

IONS;

EID: 84923344590     PISSN: 00134651     EISSN: 19457111     Source Type: Journal    
DOI: 10.1149/2.0701414jes     Document Type: Article

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