|
Volumn 493, Issue 1-3, 2010, Pages 11-18
|
Structural dynamics and transient electric-field effects in ultrafast electron diffraction from surfaces
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DYNAMICS;
ELECTRON MICROSCOPES;
ELECTRON MICROSCOPY;
POWER QUALITY;
STRUCTURAL DYNAMICS;
TRANSIENTS;
ATOMIC-SCALE RESOLUTION;
DIRECT VISUALIZATION;
GRAZING ANGLES;
SURFACE DIFFRACTION;
TRANSIENT ELECTRIC FIELDS;
ULTRAFAST ELECTRON DIFFRACTION;
ULTRAFAST ELECTRON MICROSCOPY;
ELECTRIC FIELD EFFECTS;
|
EID: 77954213028
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2010.04.049 Document Type: Article |
Times cited : (44)
|
References (28)
|