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Volumn 3, Issue 3, 2007, Pages 135-140

Laser dicing of silicon: Comparison of ablation mechanisms with a novel technology of thermally induced stress

Author keywords

Bending strength; Cutting; Laser; Silicon; Thermally induced stress

Indexed keywords


EID: 84923210915     PISSN: None     EISSN: 18800688     Source Type: Journal    
DOI: 10.2961/jlmn.2008.03.0002     Document Type: Article
Times cited : (38)

References (13)
  • 1
    • 34547731315 scopus 로고    scopus 로고
    • ALSI's Low Power Multiple Beam Tech-nology for High Throughput and Low Damage Wa-fer Dicing
    • P. Chall: ALSI's Low Power Multiple Beam Tech-nology for High Throughput and Low Damage Wa-fer Dicing. In: Proceedings of 65th Laser Material Conference. (2006) p.211-215
    • (2006) In: Proceedings of 65th Laser Material Conference , pp. 211-215
    • Chall, P.1
  • 2
    • 34547813554 scopus 로고    scopus 로고
    • Dicing of wafers by patented water-jet-guided laser: the total damage free cut
    • B. Richerzhagen, et al.: Dicing of wafers by patented water-jet-guided laser: the total damage free cut. In: Proceedings of 65th Laser Material Conference. (2006) p.197-200
    • (2006) In: Proceedings of 65th Laser Material Conference , pp. 197-200
    • Richerzhagen, B.1
  • 3
    • 34547769226 scopus 로고    scopus 로고
    • Advanced Dicing Technology for Semiconductor Wafer-Stealth Dicing
    • M. Kumagagi, et al.: Advanced Dicing Technology for Semiconductor Wafer-Stealth Dicing. In: J. IEEE Transactions on Semiconductor Manufacturing. Vol.20, No.3, (2007) p. 259-265
    • (2007) In: J. IEEE Transactions on Semiconductor Manufacturing , vol.20 , Issue.3 , pp. 259-265
    • Kumagagi, M.1
  • 5
    • 56349144813 scopus 로고    scopus 로고
    • Flexible Laser Micro Machining of Semiconductors Materials using Frequency-Quadrupled Solid-State Lasers
    • A. Ostendorf, et al.: Flexible Laser Micro Machining of Semiconductors Materials using Frequency-Quadrupled Solid-State Lasers. In: Proceedings of Micro System Technology (2003) p. 248-255
    • (2003) In: Proceedings of Micro System Technology , pp. 248-255
    • Ostendorf, A.1
  • 6
    • 0030211787 scopus 로고    scopus 로고
    • Femtosecond, picosecond and nanosecond laser ablation of solids
    • B. N. Chichkov, et al.: Femtosecond, picosecond and nanosecond laser ablation of solids. In: J. of Applied Physics, A 63 (1996) p. 109-115
    • (1996) In: J. of Applied Physics, A , vol.63 , pp. 109-115
    • Chichkov, B.N.1
  • 7
    • 0020126962 scopus 로고
    • Optical constants for silicon at 300 and 10 K determined from 1.64 to 4.73 eV by elipsometry
    • G.E. Jellison, et al.: Optical constants for silicon at 300 and 10 K determined from 1.64 to 4.73 eV by elipsometry. In: J. of Applied Physics, 53 (1982) 5
    • (1982) In: J. of Applied Physics , vol.53 , pp. 5
    • Jellison, G.E.1
  • 8
  • 12
    • 0344119440 scopus 로고    scopus 로고
    • The strength of the silicon die in flip-chip assemblies
    • B. Cotterell, Z. Chen, J.B. Haan, N.X. Tan: The strength of the silicon die in flip-chip assemblies. J. Electron Packaging (2003) 125, p.114-119
    • (2003) J. Electron Packaging , vol.125 , pp. 114-119
    • Cotterell, B.1    Chen, Z.2    Haan, J.B.3    Tan, N.X.4
  • 13
    • 33846594365 scopus 로고    scopus 로고
    • Investigations of influence of dicing techniques on the strength properties of thin silicon
    • S. Schoenfelder, et al.: Investigations of influence of dicing techniques on the strength properties of thin silicon. Microelectronics Reliability 47 (2007) p. 168-178
    • (2007) Microelectronics Reliability , vol.47 , pp. 168-178
    • Schoenfelder, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.