Particle deformation induced by AFM tapping under different setpoint voltages

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9236, Issue , 2014, Pages

  Wu, Chung Lin ^a   Farkas, Natalia ^b   Dagata, John A ^b   He, Bo Ching ^a   Fu, Wei En ^a  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

atomic force microscopy (AFM); height; polystyrene nanoparticles; setpoint voltages (SPVs)

Indexed keywords

AMINO ACIDS; DEFORMATION; FIBER OPTIC SENSORS; GOLD; MECHANICAL PROPERTIES; METAL NANOPARTICLES; MICA; NANOPARTICLES; POLYSTYRENES; SILICATE MINERALS;

GOLD NANOPARTICLES; HEIGHT; MIXED NANOPARTICLES; PARTICLE DEFORMATION; POLYSTYRENE NANOPARTICLES; SETPOINT VOLTAGE; TAPPING MODES; WELL-DISPERSED;

ATOMIC FORCE MICROSCOPY;

EID: 84923009976     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2070356     Document Type: Conference Paper

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