-
1
-
-
73149123264
-
Lateral and vertical Diameter Measurements on Polymer Particles with a Metrology AFM
-
Edited by G. Wilkening and L. Koenders, Viley-VCH Verlag Gmbh & Co. KgaA, Weinheim ISBN 3-527-40502-X
-
Meli, F., "Lateral and vertical Diameter Measurements on Polymer Particles with a Metrology AFM" in [Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range] Edited by G. Wilkening and L. Koenders, Viley-VCH Verlag Gmbh & Co. KgaA, Weinheim ISBN 3-527-40502-X (2005).
-
(2005)
Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range
-
-
Meli, F.1
-
2
-
-
80051690994
-
Diameter measurements of polystyrene particles with atomic force microscopy
-
Garnaes, J., "Diameter measurements of polystyrene particles with atomic force microscopy", Meas. Sci. Technol. 22 (2011) 094001 (8pp).
-
(2011)
Meas. Sci. Technol.
, vol.22
-
-
Garnaes, J.1
-
3
-
-
0037390706
-
Uncertainty in pitch measurements of one-dimensional grating standards using a nanometrological atomic force microscope
-
DOI 10.1088/0957-0233/14/4/309, PII S0957023303542643
-
Misumi, I., Gonda, S., Kurosawa, T. and Takamasu, K., "Uncertainty in pitch measurements of one-dimensional grating standards using a nanometrological atomic force microscope", Meas. Sci. Technol. 14 (2003) 463-471. (Pubitemid 36453936)
-
(2003)
Measurement Science and Technology
, vol.14
, Issue.4
, pp. 463-471
-
-
Misumi, I.1
Gonda, S.2
Kurosawa, T.3
Takamasu, K.4
-
4
-
-
19944412177
-
-
Dai, G., Koenders, L., Pohlenz, F., Dziomba, T. and Danzebrink, H. -U. Meas. Sci. Technol. 16 (2005) 1241-1249.
-
(2005)
Meas. Sci. Technol.
, vol.16
, pp. 1241-1249
-
-
Dai, G.1
Koenders, L.2
Pohlenz, F.3
Dziomba, T.4
Danzebrink, H.-U.5
-
5
-
-
25644433527
-
Sub-hundred nanometre pitch measurements using an AFM with differential laser interferometers for designing usable lateral scales
-
DOI 10.1088/0957-0233/16/10/025, PII S0957023305017224
-
Misumi, I., et al "Sub-hundred nanometre pitch measurements using an AFM with differential laser interferometers for designing usable lateral scales" Meas. Sci. Technol. 16 (2005) 2080-2090. (Pubitemid 41380642)
-
(2005)
Measurement Science and Technology
, vol.16
, Issue.10
, pp. 2080-2090
-
-
Misumi, I.1
Gonda, S.2
Huang, Q.3
Keem, T.4
Kurosawa, T.5
Fujii, A.6
Hisata, N.7
Yamagishi, T.8
Fujimoto, H.9
Enjoji, K.10
Aya, S.11
Sumitani, H.12
-
6
-
-
42549151876
-
Nanometric lateral scale development with Si/SiO2 multilayer thin-film structures and improvement of uncertainty evaluation using analysis of variance
-
Misumi, I., Lu, M., Tanaka, H., Sugawara, K., Gonda, S., and Kurosawa, T., "Nanometric lateral scale development with Si/SiO2 multilayer thin-film structures and improvement of uncertainty evaluation using analysis of variance", Meas. Sci. Technol. 19 (2008) 045101 (10pp).
-
(2008)
Meas. Sci. Technol.
, vol.19
-
-
Misumi, I.1
Lu, M.2
Tanaka, H.3
Sugawara, K.4
Gonda, S.5
Kurosawa, T.6
-
7
-
-
0036641453
-
Light scattering by slightly nonspherical particles on surfaces
-
Garmer, T. A., "Light scattering by slightly nonspherical particles on surfaces", Opt. Lett. 27 (2002) 1159-1161
-
(2002)
Opt. Lett.
, vol.27
, pp. 1159-1161
-
-
Garmer, T.A.1
-
8
-
-
54249145061
-
Estimation of contact area of nanoparticles in chains using continuum elastic contact mechanics
-
Globelny, J., Pradeep, N., Kim, D. -I., "Estimation of contact area of nanoparticles in chains using continuum elastic contact mechanics", J. Nanopart. Res. (2008) 10:163-169
-
(2008)
J. Nanopart. Res.
, vol.10
, pp. 163-169
-
-
Globelny, J.1
Pradeep, N.2
Kim, D.-I.3
-
9
-
-
5544224688
-
Compliance measurements of confined polystyrene solutions by atomic force microscopy
-
Overney, R. M., Leta, D. P., Pictroski, C. F., Rafailovich, M. H., Liu, Y., Quinn, J., Sokolov, J., Eisenberg, A., Overney, G., "Compliance measurements of confined polystyrene solutions by atomic force microscopy", Phys. Rev. Lett. 76 (1996) 1272-1275. (Pubitemid 126586096)
-
(1996)
Physical Review Letters
, vol.76
, Issue.8
, pp. 1272-1275
-
-
Overney, R.M.1
Leta, D.P.2
Pictroski, C.F.3
Rafailovich, M.H.4
Liu, Y.5
Quinn, J.6
Sokolov, J.7
Eisenberg, A.8
Overney, G.9
-
10
-
-
4444319317
-
Analysis of atomic force microscopy data for deformable materials
-
Rutrand, M. W., Tyrrell, J. W. G. and Attard P. "Analysis of atomic force microscopy data for deformable materials", J. Adhesion Sci. Technol. 18 (2004) 1199-1215
-
(2004)
J. Adhesion Sci. Technol.
, vol.18
, pp. 1199-1215
-
-
Rutrand, M.W.1
Tyrrell, J.W.G.2
Attard, P.3
-
11
-
-
58249141215
-
Elastic modulus and hardness of muscovite and rectorite determined by nanoindentation
-
Zhang, G., Wei, Z., Ferrell, R. E., "Elastic modulus and hardness of muscovite and rectorite determined by nanoindentation", Applied Clay Science 43 (2009) 271-281
-
(2009)
Applied Clay Science
, vol.43
, pp. 271-281
-
-
Zhang, G.1
Wei, Z.2
Ferrell, R.E.3
-
13
-
-
77955555442
-
Impact of molecular mass on the elastic modulus of thin polystyrene films
-
Torres, J. M., Stafford, C. M., Vogt, B. D., "Impact of molecular mass on the elastic modulus of thin polystyrene films", Polymer 51 (2010) 4211-4217
-
(2010)
Polymer
, vol.51
, pp. 4211-4217
-
-
Torres, J.M.1
Stafford, C.M.2
Vogt, B.D.3
-
14
-
-
84862533199
-
Effect of size dispersion on the lattice parameters of two-dimensional particle arrays: A possible uncertainty source in AFM size measurement of monodisperse particles
-
Abstract T096A04
-
Shirono, K. and Ehara, K., "Effect of size dispersion on the lattice parameters of two-dimensional particle arrays: A possible uncertainty source in AFM size measurement of monodisperse particles", European Aerosol Conference 2009, Karlsruhe, Abstract T096A04.
-
European Aerosol Conference 2009, Karlsruhe
-
-
Shirono, K.1
Ehara, K.2
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