Deformation of polystyrene nanoparticles under different AFM tapping loads

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8378, Issue , 2012, Pages

  He, Bo Ching ^a   Fu, Wei En ^b   Liou, Huay Chung ^a   Chang, Yong Qing E ^a   Pan, Shan Peng ^a   Lin, Hung Min ^b   Chen, Yen Fu ^b  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^b Bruker Taiwan/Nano Surface   (Taiwan)

Author keywords

atomic force microscopy; contact mechanics; deformation; nanoparticle; peak force tapping; polystyrene

Indexed keywords

AFM; AFM TIP; ATOMIC FORCE MICROSCOPE (AFM); CONTACT FORCES; CONTACT MECHANICS; CONTACT MODES; FULLY-PLASTIC; LINEAR RELATIONSHIPS; MEASUREMENT RESULTS; MEASUREMENT UNCERTAINTY; MICA SUBSTRATES; POLYSTYRENE NANOPARTICLES; THEORETICAL MODELS;

ATOMIC FORCE MICROSCOPY; ENVIRONMENTAL TECHNOLOGY; MICA; NANOPARTICLES; POLYSTYRENES; SCANNING; SECURITY SYSTEMS; UNCERTAINTY ANALYSIS;

DEFORMATION;

EID: 84862513969     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.921451     Document Type: Conference Paper

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