The ReactorSTM: Atomically resolved scanning tunneling microscopy under high-pressure, high-temperature catalytic reaction conditions

Review of Scientific Instruments

Volumn 85, Issue 8, 2014, Pages

  Herbschleb, C T ^a,b   Van Der Tuijn, P C ^a   Roobol, S B ^a   Navarro, V ^a   Bakker, J W ^a   Liu, Q ^a,b   Stoltz, D ^a,c   Canas Ventura M E ^a,d   Verdoes, G ^a,b   Van Spronsen, M A ^a   Bergman, M ^a   Crama, L ^a   Taminiau, I ^a,b   Ofitserov, A ^b   Van Baarle, G J C ^b   Frenken, J W M ^a,b  

^a LEIDEN UNIVERSITY   (Netherlands)

^b Leiden Probe Microscopy BV ^*  (Netherlands)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^d EVONIK INDUSTRIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL INDUSTRY; ELECTRONS; ION BOMBARDMENT; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ANALYSIS TECHNIQUES; CATALYTIC REACTIONS; HIGH-PRESSURE AND HIGH-TEMPERATURE; REACTIVITY MEASUREMENTS; ROOM TEMPERATURE; SAMPLE PREPARATION; SECOND GENERATION; THIN-FILM DEPOSITIONS;

CATALYSIS;

EID: 84922870733     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.4891811     Document Type: Article

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