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Volumn 7732, Issue , 2010, Pages

Improving the ruggedness of Silicon Pore Optics

Author keywords

Environmental testing; FEM; Pore optics; Ruggedisation; Silicon; X ray astronomy; X ray optics; X ray telescopes

Indexed keywords

FEM; PORE OPTICS; RUGGEDISATION; X RAY TELESCOPE; X-RAY ASTRONOMY;

EID: 77957859227     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.858121     Document Type: Conference Paper
Times cited : (8)

References (8)
  • 1
    • 33749022236 scopus 로고    scopus 로고
    • Assembling silicon pore optics into a modular structure
    • Graue, R. et al., "Assembling silicon pore optics into a modular structure", Proc. SPIE 6266, 62661U (2006).
    • (2006) Proc. SPIE , vol.6266
    • Graue, R.1
  • 2
    • 33749018232 scopus 로고    scopus 로고
    • Performance characterization of silicon pore optics
    • Collon, M. J. et al., "Performance characterization of silicon pore optics", Proc. SPIE 6266, 62661T (2006).
    • (2006) Proc. SPIE , vol.6266
    • Collon, M.J.1
  • 3
    • 33748991168 scopus 로고    scopus 로고
    • Metrology, integration, and performance verification of silicon pore optics in Wolter-I configuration
    • Collon, M. J. et al., "Metrology, integration, and performance verification of silicon pore optics in Wolter-I configuration", Proc. SPIE 6266, 626618 (2006).
    • (2006) Proc. SPIE , vol.6266 , pp. 626618
    • Collon, M.J.1
  • 4
    • 29844445315 scopus 로고    scopus 로고
    • Development of modular high-performance pore optics for the XEUS x-ray telescope
    • Kraft, S. et al., "Development of modular high-performance pore optics for the XEUS x-ray telescope", Proc. SPIE 5900, 297-308 (2005).
    • (2005) Proc. SPIE , vol.5900 , pp. 297-308
    • Kraft, S.1
  • 5
    • 0001873370 scopus 로고
    • Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen
    • Wolter, H., 'Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen', Annalen der Physik 445, 94-114 (1952).
    • (1952) Annalen der Physik , vol.445 , pp. 94-114
    • Wolter, H.1
  • 6
    • 70449346256 scopus 로고    scopus 로고
    • Optical bench elements (petals) for IXO
    • Kampf, D. et al., "Optical bench elements (petals) for IXO", Proc. SPIE, 7437 (2009).
    • (2009) Proc. SPIE , vol.7437
    • Kampf, D.1
  • 7
    • 77957866216 scopus 로고    scopus 로고
    • Silicon pore X-ray optics for IXO
    • these proceedings
    • Collon, M. J. et al. "Silicon Pore X-ray Optics for IXO", Proc. SPIE, these proceedings
    • Proc. SPIE
    • Collon, M.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.