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Volumn 7732, Issue , 2010, Pages
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Improving the ruggedness of Silicon Pore Optics
a a a a b b b c d d
d
OHB SYSTEM AG
(Germany)
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Author keywords
Environmental testing; FEM; Pore optics; Ruggedisation; Silicon; X ray astronomy; X ray optics; X ray telescopes
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Indexed keywords
FEM;
PORE OPTICS;
RUGGEDISATION;
X RAY TELESCOPE;
X-RAY ASTRONOMY;
ASTRONOMY;
ENVIRONMENTAL TESTING;
FASTENERS;
INSTRUMENTS;
MIRRORS;
MOUNTINGS;
OPTICAL TELESCOPES;
OPTICAL TESTING;
SPACE TELESCOPES;
SPACECRAFT EQUIPMENT;
X RAY OPTICS;
X RAYS;
GAMMA RAYS;
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EID: 77957859227
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.858121 Document Type: Conference Paper |
Times cited : (8)
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References (8)
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