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Volumn 7, Issue 5, 2015, Pages 2009-2022

Surface-enhanced spectroscopy on plasmonic oligomers assembled by AFM nanoxerography

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DECAY (ORGANIC); EMISSION SPECTROSCOPY; FINITE DIFFERENCE TIME DOMAIN METHOD; FLUORESCENCE; FLUORESCENCE MICROSCOPY; NANOPARTICLES; OLIGOMERS; PLASMONICS; RAMAN SCATTERING; RED SHIFT; SILICA; SIO2 NANOPARTICLES; SURFACE SCATTERING;

EID: 84921746745     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c4nr05092d     Document Type: Article
Times cited : (15)

References (55)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.