Reversing stealthy dopant-level circuits

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 8731, Issue , 2014, Pages 112-126

  Sugawara, Takeshi ^a   Suzuki, Daisuke ^a   Fujii, Ryoichi ^a   Tawa, Shigeaki ^a   Hori, Ryohei ^b   Shiozaki, Mitsuru ^b   Fujino, Takeshi ^b  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

^b RITSUMEIKAN UNIVERSITY   (Japan)

Author keywords

Chip reverse engineering; LSI failure analysis; Passive voltage contrast; Stealthy dopant level trojan

Indexed keywords

FAILURE (MECHANICAL); FAILURE ANALYSIS; LSI CIRCUITS; REVERSE ENGINEERING; SCANNING ELECTRON MICROSCOPY; TIMING CIRCUITS; VOLTAGE MEASUREMENT; CRYPTOGRAPHY; ION BEAMS;

ACTIVE REGIONS; ANALYSIS TECHNIQUES; ANTI-REVERSE ENGINEERINGS; CONTACT LAYERS; FOCUSED ION BEAM IMAGING; PASSIVE VOLTAGE CONTRASTS; PROGRAMMABLE DEVICES; TROJANS;

ION BEAMS; EMBEDDED SYSTEMS;

EID: 84921441391     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-662-44709-3_7     Document Type: Article

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