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Review of Scientific Instruments

Volumn 85, Issue 8, 2014, Pages

Uncertainty analysis for common Seebeck and electrical resistivity measurement systems

(3) Mackey, Jon a Dynys, Frederick b Sehirlioglu, Alp c

a University of Akron (United States)

b NASA GLENN RESEARCH CENTER (United States)

c Case Western Reserve University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POWER FACTOR; PROBES; SEEBECK COEFFICIENT; THERMOCOUPLES;

ELECTRICAL MEASUREMENT; ELECTRICAL RESISTIVITY MEASUREMENTS; MEASUREMENT TEMPERATURES; NEAR ROOM TEMPERATURE; RESISTIVITY MEASUREMENT; SOURCES OF UNCERTAINTY; THERMAL FINITE ELEMENT ANALYSIS; TOTAL MEASUREMENT UNCERTAINTY;

UNCERTAINTY ANALYSIS;

EID: 84921343495 PISSN: 00346748 EISSN: 10897623 Source Type: Journal
DOI: 10.1063/1.4893652 Document Type: Article

Times cited : (61)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.