Apparatus for Seebeck coefficient and electrical resistivity measurements of bulk thermoelectric materials at high temperature

Review of Scientific Instruments

Volumn 76, Issue 2, 2005, Pages

  Zhou, Zhenhua ^a   Uher, Ctirad ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HALL COEFFICIENT; THERMOELECTRIC COOLERS; THERMOELECTRIC MATERIALS; VACUUM SYSTEMS;

CERAMIC PRODUCTS; DATA REDUCTION; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; ELECTRIC WIRE; HIGH TEMPERATURE EFFECTS;

SEEBECK EFFECT;

EID: 13744262009     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1835631     Document Type: Article

References (15)

1. T. M. Tritt, in Semiconductors and Semimetals, edited by T. M. Tritt (Academic, San Diego, 2001), Vol. 69, p. 25.
2. C. Uher, Nav. Res. Rev. 48, 48 (1996).
3. T. M. Tritt, Mater. Res. Soc. Symp. Proc. 478, 25 (1997).
4. J. Chaussy, A. Guessous, and J. Mazuer, Rev. Sci. Instrum. 52, 1721 (1981).
5. A. L. Pope, R. T. Littleton IV, and T. M. Tritt, Rev. Sci. Instrum. 72, 3129 (2001).
6. G. R. Caskey and D. J. Sellmyer, Rev. Sci. Instrum. 40, 1280 (1969).
7. C. Wood, D. Zoltan, and G. Stapfer, Rev. Sci. Instrum. 56, 719 (1985).
8. C. Wood, A. Chmielewski, and D. Zoltan, Rev. Sci. Instrum. 59, 951 (1988).
9. B. A. Cook, J. L. Harringa, S. H. Han, and C. B. Vining, J. Appl. Phys. 78, 5474 (1995).
10. R. T. Littleton IV, J. Jeffries, M. A. Kaeser, M. Long, and T. M. Tritt, Mater. Res. Soc. Symp. Proc. 545, 137 (1998).
11. V. Raag and H. V. Kowger, Rev. Sci. Instrum. 36, 2045 (1965).
12. F. Chen, J. C. Cooley, W. L. Hults, and J. L. Smith, Rev. Sci. Instrum. 72, 4201 (2001).
13. M. Aubin, H. Ghamlouch, and P. Fournier, Rev. Sci. Instrum. 64, 2938 (1993).
14. M. A. Howson, M B. Salamon, T. A. Friedmann, J. P. Rice, and D. Ginsberg, Phys. Rev. B 41, 300 (1990).
15. C. Uher, Z. Zhou, and T. Caillat, Proceedings of the 23rd International Conference on Thermoelectrics, IEEE Conference Proceedings (in print).