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Volumn 41, Issue 6, 2012, Pages 1667-1674
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Scanning seebeck coefficient measurement system for homogeneity characterization of bulk and thin-film thermoelectric materials
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Author keywords
homogeneity; mapping; scanning; Seebeck coefficient; Thermoelectric; two dimensional
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Indexed keywords
CHEMICAL VARIATIONS;
DOPING FLUCTUATIONS;
DOPING VARIATION;
FABRICATION TECHNIQUE;
HOMOGENEITY;
INHOMOGENEITIES;
LOCAL VARIATIONS;
SCANNING APPARATUS;
SEEBECK COEFFICIENT MEASUREMENT;
SUBMILLIMETERS;
THERMOELECTRIC;
THERMOELECTRIC DEVICES;
THERMOELECTRIC MATERIAL;
THERMOELECTRIC PERFORMANCE;
THERMOELECTRIC PROPERTIES;
TRADITIONAL MATERIALS;
MAPPING;
PHASE SEPARATION;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
SEEBECK COEFFICIENT;
THERMOELECTRICITY;
TWO DIMENSIONAL;
X RAY DIFFRACTION;
THERMOELECTRIC EQUIPMENT;
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EID: 84862199516
PISSN: 03615235
EISSN: None
Source Type: Journal
DOI: 10.1007/s11664-012-2039-0 Document Type: Article |
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Times cited : (25)
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References (13)
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