Highly textured tin(II) sulfide thin films formed from sheetlike nanocrystal inks

Chemistry of Materials

Volumn 26, Issue 24, 2014, Pages 7106-7113

  Herron, Steven M ^a   Tanskanen, Jukka T ^b,c   Roelofs, Katherine E ^b   Bent, Stacey F ^b  

^a STANFORD UNIVERSITY   (United States)

^b Stanford University   (United States)

^c UNIVERSITY OF EASTERN FINLAND   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; DEPOSITION; ELECTRONIC PROPERTIES; ENERGY GAP; NANOCRYSTALS; NANOSHEETS; SULFUR COMPOUNDS; THIN FILMS; TIN;

DEGREE OF TEXTURING; ELEMENTAL COMPOSITIONS; FILM ORIENTATIONS; LAYERED SEMICONDUCTORS; OUT-OF-PLANE RESISTIVITY; SULFIDE THIN FILMS; TIN SULFIDE FILMS; TWO DIMENSIONAL (2 D);

DENSITY FUNCTIONAL THEORY;

EID: 84919776904     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm503666y     Document Type: Article

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