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Volumn 104, Issue 21, 2014, Pages

Variations of ionization potential and electron affinity as a function of surface orientation: The case of orthorhombic SnS

Author keywords

[No Author keywords available]

Indexed keywords

OPEN CIRCUIT VOLTAGE; X RAY DIFFRACTION;

EID: 84923256958     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4879558     Document Type: Article
Times cited : (62)

References (25)
  • 25
    • 84940221073 scopus 로고    scopus 로고
    • See supplementary material at for the detailed description of Kelvin force microscopy
    • See supplementary material at http://dx.doi.org/10.1063/1.4879558 for the detailed description of Kelvin force microscopy.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.