A semiconductor memory development and manufacturing perspective

European Solid-State Device Research Conference

Volumn , Issue , 2014, Pages 1-6

  Atwood, Greg ^a   Deboer, Scott ^a   Prall, Kirk ^a   Somerville, Linda ^a  

^a Micron   (United States)

Author keywords

3D Integration; DRAM; Emerging Memory; NAND; NOR; Package Technology

Indexed keywords

ELECTRONICS INDUSTRY; INTERNATIONAL TRADE; MANUFACTURE; SEMICONDUCTOR STORAGE; SOLID STATE DEVICES;

3-D INTEGRATION; EMERGING MEMORY; NAND; PACKAGE TECHNOLOGIES; SEMICONDUCTOR MEMORY; SYSTEM ARCHITECTURES; TECHNOLOGY CHALLENGES; TECHNOLOGY DEVELOPMENT;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 84911967063     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2014.6948745     Document Type: Conference Paper

References (9)

1. "Nonvolatile Memory Technologies with Emphasis on Flash", edited by J. E. Brewer and M. Gill, IEEE Press, Wiley & Sons, 2008.
2. R. Bez and A.Pirovano, "Overview of non-volatile memory technology: markets, technologies and trends", in "Advances in non-volatile memory and storage technology", edit by Yoshio Nishi, Woodhead Publishing Series in Electronic and Optical Materials, Number 64, 2014
3. Micron Press Release, "Intel, Micron Extend NAND Flash Technology Leadership With Introduction of World's First 128Gb NAND Device and Mass Production of 64Gb 20nm NAND", December 6, 2011.
4. R.F.Freitas and W.W.Wilcke, "Storage-Class Memory: The next Storage System Technology", IBM Journal of Research and Development, vol. 52(4/5), p. 439-448, 2008.
5. N.Chandrasekaran, "Challenges in 3D Memory Manufacturing and Process Integration", IEDM, Washington, 2013
6. http://www.micron.com/products/hybrid-memory-cube
7. http://www.nordson.com/en-us/divisions/dage/solutions/pcbassembly/Documents/POP%20paper-SMTA%202009-final.pdf
8. L.Baldi and G.Sandhu, "Emerging Memories", ESSDERC, Bucharest, 2013
9. K.Prall, N.Ramaswamy, W.Kinney, K.Holtzclaw, X.Chen, J.Strand, and R.Bez, "An Update on Emerging Memory: Progress to 2Xnm", International Memory Workshop (IMW), Milan, 2012