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Volumn , Issue , 2014, Pages 2877-2884

Blind image quality assessment using semi-supervised rectifier networks

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; LABELED DATA; PATTERN RECOGNITION; QUALITY CONTROL; RECTIFYING CIRCUITS;

EID: 84911384028     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2014.368     Document Type: Conference Paper
Times cited : (108)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.