|
Volumn 38, Issue , 2014, Pages 156-159
|
Monte-Carlo simulation of microwave noise in n-type InSb
|
Author keywords
Compensated semiconductor; InSb; Monte Carlo; Noise temperature
|
Indexed keywords
ELECTRIC FIELDS;
ELECTROMAGNETIC WAVE SCATTERING;
ELECTRON DENSITY MEASUREMENT;
ELECTRON GAS;
ELECTRON SCATTERING;
III-V SEMICONDUCTORS;
INDIUM ANTIMONIDES;
MONTE CARLO METHODS;
NARROW BAND GAP SEMICONDUCTORS;
SEMICONDUCTING ANTIMONY COMPOUNDS;
TEMPERATURE DISTRIBUTION;
DELOCALIZATIONS;
ELECTRIC FIELD STRENGTH;
ELECTRON-ELECTRON SCATTERING;
INSB;
LATTICE TEMPERATURES;
MICROWAVE NOISE;
MONTE CARLO CALCULATION;
NOISE TEMPERATURE;
ELECTRONS;
|
EID: 84910662098
PISSN: 12932558
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solidstatesciences.2014.10.014 Document Type: Article |
Times cited : (3)
|
References (27)
|