Enhanced noise at high bias in atomic-scale Au break junctions

Scientific Reports

Volumn 4, Issue , 2014, Pages

  Chen, Ruoyu ^a   Wheeler, Patrick J ^a   Di Ventra, M ^b   Natelson, D ^a,c  

^a RICE UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84908600214     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep04221     Document Type: Article

References (59)

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