SCOPUS 정보 검색 플랫폼

Microelectronics Reliability

Volumn 54, Issue 9-10, 2014, Pages 2070-2074

Quantitative Scanning Microwave Microscopy: A calibration flow

(2) Schweinbock T a Hommel, S a

a INFINEON TECHNOLOGIES AG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SURFACE MOUNT TECHNOLOGY;

CALIBRATION FLOW; CALIBRATION MEASUREMENTS; DEGREE OF ACCURACY; DOPING CONCENTRATION; PHYSICAL ELEMENTS; SCANNING MICROWAVE MICROSCOPIES; TIP-SAMPLE INTERACTION; TRANSMISSION LINE MODELING;

CALIBRATION;

EID: 84908555746 PISSN: 00262714 EISSN: None Source Type: Journal
DOI: 10.1016/j.microrel.2014.07.024 Document Type: Conference Paper

Times cited : (16)

References (5)

1
- 70350252798
- Springer
- Seizo Morita Roadmap of scanning probe microscopy 2007 Springer
- (2007) Roadmap of Scanning Probe Microscopy
- Morita, S.¹

2
- 78650298970
- H.P. Huber Rev Sci Instrum 81 2010 113701
- (2010) Rev Sci Instrum , vol.81 , pp. 113701
- Huber, H.P.¹

3
- 77957724246
- J. Smoliner, H.P. Huber, M. Hochleitner, Moertelmaier, and F. Kienberger JAP 108 2010 064315
- (2010) JAP , vol.108 , pp. 064315
- Smoliner, J.¹ Huber, H.P.² Hochleitner, M.³ Moertelmaier⁴ Kienberger, F.⁵

4
- 84855912798
- H.P. Huber, I. Humer, M. Hochleitner, M. Fenner, M. Moertelmaier, and C. Rankl JAP 111 2012 014301
- (2012) JAP , vol.111 , pp. 014301
- Huber, H.P.¹ Humer, I.² Hochleitner, M.³ Fenner, M.⁴ Moertelmaier, M.⁵ Rankl, C.⁶

5
- 84870723718
- K. Torigoe, M. Arita, and T. Motooka JAP 112 2012 104325
- (2012) JAP , vol.112 , pp. 104325
- Torigoe, K.¹ Arita, M.² Motooka, T.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.